Abstract: The probability of electronic products being affected by electrostatic discharge (ESD) depends on the probability of the device being subjected to ESD and the voltage level. By determining ...
Abstract: The impact of the total ionizing dose (TID) on low leakage electrostatic discharge (ESD) protection devices fabricated on the 180-nm double silicon on insulator (DSOI) technology is ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback