Terahertz scanner examines active semiconductors contactlessly

Researchers are imaging the p-n junction of semiconductors during operation and through the casing, but so far only for ...
IEEE

Complementary Field-Effect Transistor (CFET) Demonstration at 48nm Gate Pitch for Future Logic Technology Scaling

Abstract: This study establishes the groundwork for an industry-applicable, integrated nanosheet-based monolithic CFET process architecture with a gate pitch of 48nm. By introducing the middle ...
IEEE

XNOR-XOR based Full Adder Using Double Pass Transistor Logic

Abstract: The XNOR-XOR circuit is a vital part of several arithmetic circuits. An 8T full-adder circuit and a 4T XNOR-XOR circuit are presented in this study. Due to the proposed circuits, extremely ...